Nonlinearity measurements of thin films by third-harmonic-generation microscopy

Physical Review E - Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics

Volumn 66, Issue 6, 2002, Pages 4-

  Barille, R ^a   Canioni, L ^a   Sarger, L ^a   Rivoire, G ^a  

^a UNIVERSITÉ D'ANGERS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

FIBER BRAGG GRATINGS; HARMONIC GENERATION; INTERFACES (MATERIALS); LASER BEAMS; MICROSCOPIC EXAMINATION; OPTICAL KERR EFFECT; REFRACTIVE INDEX;

LASER EXCITATION; LIQUID FILMS; NONLINEAR SUSCEPTIBILITY; NONLINEARITY MEASUREMENTS; THIRD HARMONIC GENERATION (THG) MICROSCOPY;

THIN FILMS;

ARTICLE;

EID: 37649028482     PISSN: 1063651X     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevE.66.067602     Document Type: Article

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