Photoinduced effects in the vicinity of the smectic-C α*-smectic-A transition

Physical Review E - Statistical, Nonlinear, and Soft Matter Physics

Volumn 65, Issue 3, 2002, Pages

  Prasad, S Krishna ^a   Sandhya, K L ^a   Negi, Y S ^b  

^a CENTRE FOR NANO AND SOFT MATTER SCIENCES   (India)

^b CENTRE FOR MATERIALS FOR ELECTRONICS TECHNOLOGY C MET   (India)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIFERROELECTRIC MATERIALS; DIELECTRIC PROPERTIES; ELECTRIC FIELD EFFECTS; MATHEMATICAL MODELS; NEMATIC LIQUID CRYSTALS; PERMITTIVITY; PHASE TRANSITIONS; RELAXATION PROCESSES; ULTRAVIOLET RADIATION; VACUUM;

Α-SMECTIC-A TRANSITION; NEMATIC MESOPHASE; PHOTOINDUCED EFFECTS; SMECTIC-C; TILT FLUCTUATION MODE;

SMECTIC LIQUID CRYSTALS;

EID: 37649026625     PISSN: 15393755     EISSN: 15502376     Source Type: Journal    
DOI: 10.1103/PhysRevE.65.031718     Document Type: Article

References (24)

1. See, e.g., H. Rau, in Photochemistry and Photophysics, edited by J. F. Rabek (CRC Press, Boca Raton, FL, 1989), Vol. II.
2. T. Ikeda and O. Tsutsumi, Science 268, 1873 (1995).
3. H. Knobloch, H. Orendi, M. Buchel, T. Seki, S. Ito, and W. Knoll, J. Appl. Phys. 77, 481 (1995).
4. A. Stracke, J.H. Wendorff, D. Janietz, and S. Mahlstedt, Adv. Mater. 11, 1025 (1999).
5. A.Y. Bobrovsky, N.I. Boiko, V. Shibaev, and J. Springer, Adv. Mater. 12, 1180 (2000).
6. Geetha G. Nair, S. Krishna Prasad, and C.V. Yelamaggad, J. Appl. Phys. 87, 2084 (2000).
7. C.H. Legge and G.R. Mitchell, J. Phys. D 25, 492 (1992).
8. T. Ikeda, T. Sasaki, and K. Ichimura, Nature (London) 361, 428 (1993).
9. S. Servaty, F. Kremer, A. Schonfeld, and R. Zentel, Z. Phys. Chem. (Munich) 190, 73 (1995).
10. S. Krishna Prasad and Geetha G. Nair, Adv. Mater. 13, 40 (2001).
11. A.D.L. Chandani, E. Gorecka, Y. Ouchi, H. Takezoe, and A. Fukuda, Jpn. J. Appl. Phys., Part 2 28, L1265 (1989).
12. See, e.g., P. Mach, R. Pindak, A.M. Levelut, P. Barois, H.T. Nguyen, C.C. Huang, and L. Furenlid, Phys. Rev. Lett. 81, 1015 (1998); D.A. Olson, S. Pankratz, P.M. Johnson, A. Cady, H.T. Nguyen, and C.C. Huang, Phys. Rev. E 63, 061711 (2001).
13. See, e.g., P. Mach, R. Pindak, A.M. Levelut, P. Barois, H.T. Nguyen, C.C. Huang, and L. Furenlid, Phys. Rev. Lett. 81, 1015 (1998); D.A. Olson, S. Pankratz, P.M. Johnson, A. Cady, H.T. Nguyen, and C.C. Huang, Phys. Rev. E 63, 061711 (2001).
14. For a review see, H. Takezoe and Y. Takanishi, in Chirality in Liquid Crystals, edited by H. S. Kitzerow and C. Bahr (Springer-Verlag, New York, 2001).
15. K. Shirota and I. Yamaguchi, Jpn. J. Appl. Phys. 36, L1035 (1997).
16. V. Borisenko, D.C. Burns, Z. Zhang, and G.A. Woolley, J. Am. Chem. Soc. 122, 6364 (2000); L. Komitov and K. Ichimura, Mol. Cryst. Liq. Cryst. Suppl. Ser. 360, 161 (2001).
17. V. Borisenko, D.C. Burns, Z. Zhang, and G.A. Woolley, J. Am. Chem. Soc. 122, 6364 (2000); L. Komitov and K. Ichimura, Mol. Cryst. Liq. Cryst. Suppl. Ser. 360, 161 (2001).
18. S. Havriliak and S. Negami, J. Polym. Sci., Part C: Polym. Symp. 14, 99 (1966).
19. S. Krishna Prasad, S.M. Khened, V.N. Raja, S. Chandrasekhar, and B. Shivakumar, Ferroelectrics 138, 37 (1993).
20. K. L. Sandhya, S. Krishna Prasad, and Geetha G. Nair, Phys. Rev. E 64, 041702 (2001).
21. * transition is known to exhibit large critical fluctuations [K. Ema, M. Ogawa, A. Takagi, and H. Yao, Phys. Rev. E 54, R25 (1996); M. Skarabot, K. Kocevar, R. Blinc, G. Heppke, and I. Musevic, ibid 59, R1323 (1999)]. Thus a meanfield analysis of the data would not be perfectly valid. As the comparison between behavior in the the UV OFF and ON states is not about the temperature dependences of the parameter and also the absence of any available expression that incorporates the critical fluctuations for the dielectric parameters, we employ here meanfield expressions.
22. * transition is known to exhibit large critical fluctuations [K. Ema, M. Ogawa, A. Takagi, and H. Yao, Phys. Rev. E 54, R25 (1996); M. Skarabot, K. Kocevar, R. Blinc, G. Heppke, and I. Musevic, ibid 59, R1323 (1999)]. Thus a meanfield analysis of the data would not be perfectly valid. As the comparison between behavior in the the UV OFF and ON states is not about the temperature dependences of the parameter and also the absence of any available expression that incorporates the critical fluctuations for the dielectric parameters, we employ here meanfield expressions.
23. M.R. Dodge, C. Rosenblatt, R. Petschek, M.E. Neubert, and M.E. Walsh, Phys. Rev. E 62, 5056 (2000).
24. Geetha G. Nair, S. Krishna Prasad, Uma S. Hiremath, and C.V. Yelamaggad, J. Appl. Phys. 90, 48 (2001).