Energy gap measurement of nanostructured aluminium thin films for single Cooper-pair devices

Superconductor Science and Technology

Volumn 21, Issue 1, 2008, Pages

  Court, N A ^a   Ferguson, A J ^a,b   Clark, R G ^a  

^a UNIVERSITY OF NEW SOUTH WALES   (Australia)

^b UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; ENERGY GAP; FILM THICKNESS; GRAIN SIZE AND SHAPE; NANOSTRUCTURES; SUPERCONDUCTING DEVICES;

COOPER-PAIR DEVICES; SUPERCONDUCTING GAP;

THIN FILMS;

EID: 37549062612     PISSN: 09532048     EISSN: 13616668     Source Type: Journal    
DOI: 10.1088/0953-2048/21/01/015013     Document Type: Article

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