Core and grain boundary sensitivity of tungsten-oxide sensor devices by molecular beam assisted particle deposition

Journal of Applied Physics

Volumn 102, Issue 12, 2007, Pages

  Huelser, T P ^a   Lorke, A ^a   Ifeacho, P ^a   Wiggers, H ^a   Schulz, C ^a  

^a UNIVERSITY OF DUISBURG ESSEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; GRAIN BOUNDARIES; MASS SPECTROMETRY; MOLECULAR BEAMS; SYNTHESIS (CHEMICAL); X RAY DIFFRACTION;

GRAIN BOUNDARY SENSITIVITY; PARTICLE DEPOSITION; TUNGSTEN HEXAFLUORIDE (WF6); TUNGSTEN-OXIDE SENSOR DEVICES;

TUNGSTEN COMPOUNDS;

EID: 37549015658     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2817612     Document Type: Article

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