AOT dispersed single-walled carbon nanotubes for transistor device application

Materials Letters

Volumn 62, Issue 6-7, 2008, Pages 843-845

  Wang, Shiunchin C ^a   Yang, Hui ^a,b   Banerjee, Sarbajit ^c   Herman, Irving P ^c   Akins, Daniel L ^a  

^a CITY COLLEGE OF NEW YORK   (United States)

^b SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY   (China)

^c Och Spine at New York Presbyterian Hospitals   (United States)

Author keywords

Carbon nanotube; Characterization method; Dielectrics; Nanomaterials; Surfactant

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRITICAL MICELLE CONCENTRATION; DIELECTRIC MATERIALS; DISPERSIONS; TRANSISTORS; ULTRAVIOLET SPECTROSCOPY;

CHARACTERIZATION METHODS; DEVICE CONFIGURATIONS; DIOCTYL SODIUM SULFOSUCCINATE; MICELLAR CONCENTRATIONS;

SINGLE-WALLED CARBON NANOTUBES (SWCN);

EID: 37449017368     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2007.07.001     Document Type: Article

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