The orthorhombic FeIn complex in silicon

Materials Science Forum

Volumn 258-263, Issue PART 1, 1997, Pages 455-460

  Tidlund, Per ^a   Kleverman, Mats ^a  

^a LUND UNIVERSITY   (Sweden)

Author keywords

Fe; FTIR; In; Si; Uniaxial stress; Zeeman

Indexed keywords

CRYSTAL IMPURITIES; ELECTRON ENERGY LEVELS; ELECTRONIC STRUCTURE; FOURIER TRANSFORM INFRARED SPECTROSCOPY; IONS; IRON COMPOUNDS; PARAMAGNETIC RESONANCE; STRESS ANALYSIS;

UNIAXIAL STRESS;

SEMICONDUCTING SILICON;

EID: 3743061461     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.258-263.455     Document Type: Article

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