High-temperature-dependent optical properties of ZnO film on sapphire substrate

Thin Solid Films

Volumn 516, Issue 6, 2008, Pages 1137-1141

  Sui, Chenghua ^a   Chen, Naibo ^a   Xu, Xiaojun ^a   Wei, Gaoyao ^a   Cai, Pinggen ^a   Zhou, Hong ^a  

^a ZHEJIANG UNIVERSITY OF TECHNOLOGY   (China)

Author keywords

Annealing; Optical properties; Zinc oxide

Indexed keywords

ATOMIC FORCE MICROSCOPY; HIGH TEMPERATURE EFFECTS; LIGHT ABSORPTION; OPTICAL PROPERTIES; THERMODYNAMIC STABILITY; X RAY DIFFRACTION ANALYSIS; ZINC OXIDE;

OPTICAL ABSORPTION EDGE CURVES; SAPPHIRE SUBSTRATES; ULTRAVIOLET VISIBLE TRANSMISSIONS; X-RAY DIFFRACTION MEASUREMENTS;

THIN FILMS;

EID: 37349121919     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2007.05.065     Document Type: Article

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