Assembly faults diagnosis using neural networks and process knowledge

Proceedings of the ASME International Manufacturing Science and Engineering Conference 2007, MSEC2007

Volumn , Issue , 2007, Pages 565-572

  Zhao, Qiangsheng ^a   Camelio, Jaime ^a  

^a Michigan Technological University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIAGNOSIS TOOL; MANUFACTURING ENVIRONMENT; MANUFACTURING PROCESS FAULTS; SENSOR DEVELOPMENTS;

BACKPROPAGATION; FAILURE ANALYSIS; FAULT DETECTION; SENSORS; STATISTICAL PROCESS CONTROL;

NEURAL NETWORKS;

EID: 37349098740     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1115/MSEC2007-31095     Document Type: Conference Paper

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