Short-stack modeling of degradation in solid oxide fuel cells. Part I. Contact degradation

Journal of Power Sources

Volumn 176, Issue 1, 2008, Pages 138-154

  Gazzarri, J I ^a   Kesler, O ^b  

^a UNIVERSITY OF BRITISH COLUMBIA   (Canada)

^b UNIVERSITY OF TORONTO   (Canada)

Author keywords

Degradation; Diagnosis; Impedance spectroscopy; Model; SOFC

Indexed keywords

COMPUTER SIMULATION; DEGRADATION; OXIDATION; SENSITIVITY ANALYSIS;

CONTACT DEGRADATION; IMPEDANCE SPECTROSCOPY; INTERCONNECT OXIDATION; SHORT-STACK MODELING;

SOLID OXIDE FUEL CELLS (SOFC);

EID: 37349089088     PISSN: 03787753     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpowsour.2007.10.047     Document Type: Article

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