Simulation of SOFC stack and repeat elements including interconnect degradation and anode reoxidation risk

Journal of Power Sources

Volumn 161, Issue 1, 2006, Pages 392-403

  Larrain, D ^a   Van herle, J ^a   Favrat, D ^a  

^a EPFL   (Switzerland)

Author keywords

Degradation; Interconnect; Modeling; Solid oxide fuel cell; Stack

Indexed keywords

ANODES; COMPUTER SIMULATION; CURRENT DENSITY; DEGRADATION;

INTERCONNECT DEGRADATION; OXIDE SCALE GROWTH; REOXIDATION POTENTIAL; STACK; WAGNER'S LAW;

SOLID OXIDE FUEL CELLS;

EID: 33749133445     PISSN: 03787753     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpowsour.2006.04.151     Document Type: Article

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