Enhanced electronic conductivity in Si-substituted calcium aluminate

Journal of Applied Physics

Volumn 102, Issue 11, 2007, Pages

  Bertoni, Mariana I ^a   Mason, Thomas O ^a   Medvedeva, Julia E ^b   Wang, Yongqiang ^c   Freeman, Arthur J ^d   Poeppelmeier, Kenneth R ^d  

^a Northwestern University   (United States)

^b MISSOURI UNIVERSITY OF SCIENCE AND TECHNOLOGY   (United States)

^c LOS ALAMOS NATIONAL LABORATORY   (United States)

^d NORTHWESTERN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DENSITY FUNCTIONAL THEORY; ELECTRIC CONDUCTIVITY; POLARONS; SEEBECK COEFFICIENT; SEMICONDUCTING SILICON; ULTRAVIOLET DEVICES;

CALCIUM ALUMINATE; ENHANCED ELECTRONIC CONDUCTIVITY; POLARON CONDUCTION; ULTRAVIOLET ELECTRONIC CONDUCTOR;

CALCIUM COMPOUNDS;

EID: 37149041641     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2817605     Document Type: Article

References (32)

1. D. S. Ginley and C. Bright, MRS Bull. 25, 15 (2000).
2. H. Hosono, Int. J. Appl. Ceram. Technol. 1, 106 (2004).
3. T. Minami, MRS Bull. 25, 38 (2000).
4. B. G. Lewis and D. C. Paine, MRS Bull. 25, 22 (2000).
5. G. Thomas, Nature (London) 0028-0836 10.1038/39999 389, 907 (1997).
6. H. Bartl and T. Scheller, Neues Jahrb. Miner. Monatsh. 35, 547 (1970). 0028-3649
7. K. Hayashi, S. Matsuishi, T. Kamiya, M. Hirano, and H. Hosono, Nature (London) 0028-0836 10.1038/nature01053 419, 462 (2002).
8. K. Hayashi, P. V. Sushko, A. L. Shluger, M. Hirano, and H. Hosono, J. Phys. Chem. B 1089-5647 10.1021/jp053990p 109, 23836 (2005).
9. S. Matsuishi, K. Hayashi, M. Hirano, and H. Hosono, J. Am. Chem. Soc. 127, 12454 (2005). 0002-7863
10. J. E. Medvedeva, A. J. Freeman, M. I. Bertoni, and T. O. Mason, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.93.016408 93, 016408 (2004).
11. J. E. Medvedeva and A. J. Freeman, Europhys. Lett. 69, 583 (2005).
12. M. I. Bertoni, T. O. Mason, J. E. Medvedeva, A. J. Freeman, K. R. Poeppelmeier, and B. Delley, J. Appl. Phys. 0021-8979 10.1063/1.1899246 97, 103713 (2005).
13. S. Fujita, M. Ohkawa, K. Suzuki, H. Nakano, T. Mori, and H. Masuda, Chem. Mater. 0897-4756 10.1021/cm030562s 15, 4879 (2003).
14. S. Fujita, K. Suzuki, M. Ohkawa, T. Mori, Y. Iida, Y. Miwa, H. Masuda, and S. Shimada, Chem. Mater. 0897-4756 10.1021/cm0204122 15, 255 (2003).
15. F. Pertlik, Geolines. 15, 113 (2003).
16. R. Siauciunas and A. Baltusnikas, Cem. Concr. Res. 33, 1789 (2003). 0008-8846
17. S. Matsuishi, Y. Toda, M. Miyakawa, K. Hayashi, T. Kamiya, M. Hirano, I. Tanaka, and H. Hosono, Science 0036-8075 10.1126/science.1083842 301, 626 (2003).
18. M. Miyakawa, K. Hayashi, M. Hirano, Y. Toda, T. Kamiya, and H. Hosono, Adv. Mater. 15, 1100 (2003). 0935-9648
19. L. J. van der Pauw, Philips Res. Rep. 13, 1 (1958).
20. B. S. Hong, S. J. Ford, and T. O. Mason, Key Eng. Mater. 125, 163 (1997). 1013-9826
21. J. Hwang, Ph.D. thesis, Northwestern University, 1996.
22. E. Wimmer, H. Krakauer, M. Weinert, and A. J. Freeman, Phys. Rev. B 0163-1829 10.1103/PhysRevB.24.864 24, 864 (1981).
23. O. K. Andersen and M. Jepsen, Electronic Band Structure and Its Applications (Springer, Berlin, 1986).
24. J. E. Medvedeva and A. J. Freeman, Appl. Phys. Lett. 0003-6951 10.1063/1.1781362 85, 955 (2004).
25. The fact that the conductivity has a hopping nature follows from the detailed analysis of the self-consistent density of states (DOS) of the UV-activated systems. We found that the largest contributions in the vicinity of EF are from the particular atoms which are spatially well separated from each other. Furthermore, the DOS at EF exhibits a Coulomb gap-a distinctive feature of variable range hopping. Fitting the Coulomb gap allowed predictions of the characteristic temperatures which agree well with experiment (see Ref.).
26. N. M. Tallan, Electrical Conductivity in Ceramics and Glass (Marcel Dekker, New York, 1974).
27. J. Nell, B. J. Wood, S. E. Dorris, and T. O. Mason, J. Solid State Chem. 0022-4596 10.1016/0022-4596(89)90289-2 82, 247 (1989).
28. D. P. Karim and A. T. Aldred, Phys. Rev. B 0163-1829 10.1103/PhysRevB.20. 2255 20, 2255 (1979).
29. T. O. Mason and H. K. Bowen, J. Am. Ceram. Soc. 64, 237 (1981). 0002-7820
30. E. Gartstein, T. O. Mason, and J. B. Cohen, Am. Ceram. Soc. Bull. 60, 375 (1981). 0002-7812
31. P. V. Sushko, A. L. Shluger, K. Hayashi, M. Hirano, and H. Hosono, Thin Solid Films 0040-6090 10.1016/S0040-6090(03)01156-8 445, 161 (2003).
32. Z. Y. Li, J. L. Yang, J. G. Hou, and Q. S. Zhu, Angew. Chem., Int. Ed. 1433-7851 10.1002/anie.200461200 43, 6479 (2004).