Bis(ν5-1,3-di-tert-butylcyclopentadienyl)chromium(II)

Acta Crystallographica Section E: Structure Reports Online

Volumn 63, Issue 12, 2007, Pages

  Schultz, Madeleine ^a  

^a QUEENSLAND UNIVERSITY OF TECHNOLOGY   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 36849043779     PISSN: 16005368     EISSN: 16005368     Source Type: Journal    
DOI: 10.1107/S1600536807059491     Document Type: Article

References (13)

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10. Sheldrick, G. M. (1995). XPREP. Version 5.03. Siemens X-ray Instruments Inc., Madison, Wisconsin, USA.
11. Sheldrick, G. M. (1997). SHELXS97 and SHELXL97. University of Göttingen, Germany.
12. Sheldrick, G. M. (1998). SHELXTL. Bruker AXS Inc., Madison, Wisconsin, USA.
13. Siemens (1995). SMART and SAINT. Siemens X-ray Instruments Inc., Madison, Wisconsin, USA.