Silver oligomer and single fullerene electronic properties revealed by a scanning tunnelling microscope

European Physical Journal D

Volumn 45, Issue 3, 2007, Pages 465-469

  Jensen, H ^a   Kroger J ^a   Neel N ^a   Berndt, R ^a  

^a UNIVERSITY OF KIEL   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC PROPERTIES; FULLERENES; MOLECULES; SCANNING TUNNELING MICROSCOPY; SILVER; TEMPERATURE;

CLUSTER SIZES; CONSTANT-CURRENT; CURRENT SPECTRA; ENERGY SHIFT; LOW-TEMPERATURE SCANNING TUNNELING MICROSCOPY; ONE-DIMENSIONAL CHAINS; RESONANCE PEAK; SCANNING TUNNELLING MICROSCOPES; SCANNING TUNNELLING MICROSCOPY AND SPECTROSCOPY; SINGLE RESONANCE;

OLIGOMERS;

EID: 36749102580     PISSN: 14346060     EISSN: 14346079     Source Type: Journal    
DOI: 10.1140/epjd/e2007-00157-x     Document Type: Article

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