A genetic approach for efficient outlier detection in projected space

Pattern Recognition

Volumn 41, Issue 4, 2008, Pages 1338-1349

  Bandyopadhyay, Sanghamitra ^a   Santra, Santanu ^a  

^a INDIAN STATISTICAL INSTITUTE   (India)

Author keywords

Deviation detection; Gene expression; Genetic algorithm; Grid count tree; Outlier; Projected dimension

Indexed keywords

DATA STRUCTURES; DECISION TREES; GENETIC ALGORITHMS; PROBLEM SOLVING; VALUE ENGINEERING;

DEVIATION DETECTION; GRID COUNT TREE; OUTLIER; PROJECTED DIMENSIONS; SPARSITY FACTORS;

GENE EXPRESSION;

EID: 36749021623     PISSN: 00313203     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.patcog.2007.10.003     Document Type: Article

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