Outlier detection for high dimensional data

Proceedings of the ACM SIGMOD International Conference on Management of Data

Volumn , Issue , 2001, Pages 37-46

  Aggarwal, C C ^a   Yu, P S ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0034832620     PISSN: 07308078     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/375663.375668     Document Type: Conference Paper

References (27)