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Volumn 353, Issue 52-54, 2007, Pages 4672-4680
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Quantitative AFM analysis of phase separated borosilicate glass surfaces
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Author keywords
Atomic force and scanning tunneling microscopy; Borosilicates; Phases and equilibria
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
ETCHING;
HEAT TREATMENT;
PHASE EQUILIBRIA;
PHASE SEPARATION;
SCANNING TUNNELING MICROSCOPY;
BOROSILICATES;
CHEMICAL ETCHING;
BOROSILICATE GLASS;
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EID: 36549030389
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jnoncrysol.2007.07.005 Document Type: Article |
Times cited : (18)
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References (28)
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