Atomic scale imaging of amorphous silicate glass surfaces by scanning force microscopy

Journal of Non-Crystalline Solids

Volumn 351, Issue 12-13, 2005, Pages 1089-1096

  Raberg, W ^a   Ostadrahimi, A H ^a   Kayser, T ^a   Wandelt, K ^a  

^a UNIVERSITY OF BONN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; ATOMIC FORCE MICROSCOPY; BONDING; CRYSTALLINE MATERIALS; FUSED SILICA; IMAGING TECHNIQUES; QUASICRYSTALS; SILICATES; STATISTICAL METHODS; SURFACE STRUCTURE;

AMORPHOUS GLASS; AMORPHOUS SOLIDS; ATOMIC SCALE IMAGING; ROTATIONAL SYMMETRY;

SURFACE TREATMENT;

EID: 17744378624     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2005.01.022     Document Type: Conference Paper

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