Semiempirical method for calculation of secondary electron emission coefficients of insulating materials using their spectra of x-ray photoelectron spectroscopy

Journal of Materials Research

Volumn 22, Issue 11, 2007, Pages 3178-3185

  Heo, Tae Wook ^a   Moon, Sung Hwan ^a,b   Park, Sun Young ^a   Kim, Jae Hyuk ^a,b   Kim, Hyeong Joon ^a  

^a Seoul National University   (South Korea)

^b Samsung SDI   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

PLASMA DISPLAY DEVICES; SECONDARY EMISSION; VALENCE BANDS; X RAY PHOTOELECTRON SPECTROSCOPY;

CORE BANDS; SECONDARY ELECTRON EMISSION COEFFICIENTS;

INSULATING MATERIALS;

EID: 36549028399     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/jmr.2007.0390     Document Type: Article

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