Measurement of energy relaxation time in a microwave-driven Josephson junction

Superconductor Science and Technology

Volumn 20, Issue 11, 2007, Pages

  Sun, Guozhu ^a   Wang, Yiwen ^a   Cao, Junyu ^a   Chen, Jian ^a   Ji, Zhengming ^a   Kang, Lin ^a   Xu, Weiwei ^a   Yu, Yang ^a   Han, Siyuan ^a,b  

^a NANJING UNIVERSITY   (China)

^b UNIVERSITY OF KANSAS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT DENSITY; MICROWAVE DEVICES; RELAXATION TIME; RESONANT TUNNELING; SWITCHING CIRCUITS;

ENERGY RELAXATION TIME; MICROWAVE-ASSISTED TUNNELING; SWITCHING CURRENT DISTRIBUTIONS;

JOSEPHSON JUNCTION DEVICES;

EID: 36448985678     PISSN: 09532048     EISSN: 13616668     Source Type: Journal    
DOI: 10.1088/0953-2048/20/11/S26     Document Type: Conference Paper

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