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Volumn 449, Issue 1-2, 2008, Pages 322-325
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Characterization of LiMn2O4 thin films grown on Si substrates by pulsed laser deposition
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Author keywords
Capacity; LiMn2O4 thin films; Pulsed laser deposition; Raman; XRD
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Indexed keywords
CRYSTAL STRUCTURE;
CURRENT DENSITY;
FILM GROWTH;
LITHIUM COMPOUNDS;
PULSED LASER DEPOSITION;
X RAY DIFFRACTION;
DEINTERCALATION;
LATTICE CHANGE;
SPECIFIC CAPACITY;
STRUCTURE CHANGES;
THIN FILMS;
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EID: 36349010800
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jallcom.2006.01.130 Document Type: Article |
Times cited : (19)
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References (17)
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