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Volumn 91, Issue 21, 2007, Pages

Forward tunneling effect and metal-insulator transition in the BaTi O3 film/Si n-n heterojunction

Author keywords

[No Author keywords available]

Indexed keywords

BARIUM COMPOUNDS; ELECTRON TUNNELING; HETEROJUNCTIONS; SEMICONDUCTING SILICON; THERMAL EFFECTS;

ELECTRICAL VOLTAGE; JUNCTION RESISTANCE; SILICON SUBSTRATES;

METAL INSULATOR TRANSITION;

EID: 36348940373 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.2817936 Document Type: Article

Times cited : (14)

References (15)

1
- 0000045847
- P. Calvani, M. Capizzi, F. Donato, S. Lupi, P. Maselli, and D. Peschiaroli, Phys. Rev. B 47, 8917 (1993).
- (1993) Phys. Rev. B , vol.47 , pp. 8917
- Calvani, P.¹ Capizzi, M.² Donato, F.³ Lupi, S.⁴ Maselli, P.⁵ Peschiaroli, D.⁶

2
- 0000712035
- D. A. Crandles, B. Nicholas, C. Dreher, C. C. Homes, A. W. McConnell, B. P. Clayman, W. H. Gong, and J. E. Greedan, Phys. Rev. B 59, 12842 (1999).
- (1999) Phys. Rev. B , vol.59 , pp. 12842
- Crandles, D.A.¹ Nicholas, B.² Dreher, C.³ Homes, C.C.⁴ McConnell, A.W.⁵ Clayman, B.P.⁶ Gong, W.H.⁷ Greedan, J.E.⁸

3
- 0000030312
- N. Shanthi and D. D. Sarma, Phys. Rev. B 57, 2153 (1998).
- (1998) Phys. Rev. B , vol.57 , pp. 2153
- Shanthi, N.¹ Sarma, D.D.²

4
- 33751567031
- S. M. Guo, Y. G. Zhao, C. M. Xiong, and P. L. Lang, Appl. Phys. Lett. 89, 223506 (2006).
- (2006) Appl. Phys. Lett. , vol.89 , pp. 223506
- Guo, S.M.¹ Zhao, Y.G.² Xiong, C.M.³ Lang, P.L.⁴

5
- 0032070569
- Y. Watanabe, D. Sawamura, and M. Okano, Solid State Ionics 108, 109 (1998).
- (1998) Solid State Ionics , vol.108 , pp. 109
- Watanabe, Y.¹ Sawamura, D.² Okano, M.³

6
- 33748270237
- D. Hunter, K. Lord, T. M. Williams, K. Zhang, and A. K. Pradhan, Appl. Phys. Lett. 89, 092102 (2006).
- (2006) Appl. Phys. Lett. , vol.89 , pp. 092102
- Hunter, D.¹ Lord, K.² Williams, T.M.³ Zhang, K.⁴ Pradhan, A.K.⁵

7
- 0000879872
- Y. Watanabe, Phys. Rev. B 57, 5563 (1998).
- (1998) Phys. Rev. B , vol.57 , pp. 5563
- Watanabe, Y.¹

8
- 0000517705
- M. Copel, P. R. Duncombe, D. A. Neumayer, T. M. Shaw, and R. M. Tromp, Appl. Phys. Lett. 70, 3227 (1997).
- (1997) Appl. Phys. Lett. , vol.70 , pp. 3227
- Copel, M.¹ Duncombe, P.R.² Neumayer, D.A.³ Shaw, T.M.⁴ Tromp, R.M.⁵

9
- 1042273187
- S. R. Gilbert, L. A. Wills, B. W. Wessels, J. L. Schindler, J. A. Thomas, and C. R. Kannewurf, J. Appl. Phys. 80, 969 (1996).
- (1996) J. Appl. Phys. , vol.80 , pp. 969
- Gilbert, S.R.¹ Wills, L.A.² Wessels, B.W.³ Schindler, J.L.⁴ Thomas, J.A.⁵ Kannewurf, C.R.⁶

10
- 0010573440
- T. Zhao, Z. H. Chen, F. Chen, H. B. Lu, G. Z. Yang, and H. S. Cheng, Appl. Phys. Lett. 77, 4338 (2000).
- (2000) Appl. Phys. Lett. , vol.77 , pp. 4338
- Zhao, T.¹ Chen, Z.H.² Chen, F.³ Lu, H.B.⁴ Yang, G.Z.⁵ Cheng, H.S.⁶

11
- 17944382779
- H. Z. Guo, Y. H. Huang, K. J. Jin, Q. L. Zhou, H. B. Lu, L. F. Liu, Y. L. Zhou, B. L. Cheng, and Z. H. Chen, Appl. Phys. Lett. 86, 123502 (2005).
- (2005) Appl. Phys. Lett. , vol.86 , pp. 123502
- Guo, H.Z.¹ Huang, Y.H.² Jin, K.J.³ Zhou, Q.L.⁴ Lu, H.B.⁵ Liu, L.F.⁶ Zhou, Y.L.⁷ Cheng, B.L.⁸ Chen, Z.H.⁹

12
- 36348937346
- L. H. Chong, K. Mallik, and C. H. de Groot, Microelectron. Eng. 81, 170 (2005).
- (2005) Microelectron. Eng. , vol.81 , pp. 170
- Chong, L.H.¹ Mallik, K.² De Groot, C.H.³

13
- 0141828178
- A. Tiwari, C. Jin, D. Kumar, and J. Narayan, Appl. Phys. Lett. 83, 1773 (2003).
- (2003) Appl. Phys. Lett. , vol.83 , pp. 1773
- Tiwari, A.¹ Jin, C.² Kumar, D.³ Narayan, J.⁴

14
- 0037074292
- H. Tanaka, J. Zhang, and T. Kawai, Phys. Rev. Lett. 88, 027204 (2002).
- (2002) Phys. Rev. Lett. , vol.88 , pp. 027204
- Tanaka, H.¹ Zhang, J.² Kawai, T.³

15
- 0035872897
- G. D. Wilk, R. M. Wallace, and J. M. Anthony, J. Appl. Phys. 89, 5243 (2001).
- (2001) J. Appl. Phys. , vol.89 , pp. 5243
- Wilk, G.D.¹ Wallace, R.M.² Anthony, J.M.³

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