Oscillator strength measurements in Pr II with the fast-ion-beam laser-induced-fluorescence technique

Physica Scripta

Volumn 76, Issue 5, 2007, Pages 577-592

  Li, R ^a   Chatelain, R ^b   Holt, R A ^a   Rehse, S J ^c   Rosner, S D ^a   Scholl, T J ^a  

^a UNIVERSITY OF WESTERN ONTARIO   (Canada)

^b MCGILL UNIVERSITY   (Canada)

^c WAYNE STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON TRANSITIONS; FLUORESCENCE; ION BEAMS; LASER APPLICATIONS; PRASEODYMIUM COMPOUNDS; UNCERTAINTY ANALYSIS;

BRANCHING FRACTIONS; DECAY BRANCHES; FAST-ION-BEAM LASER-INDUCED-FLUORESCENCE TECHNIQUE; OSCILLATOR STRENGTHS;

CRYSTAL OSCILLATORS;

EID: 36248990767     PISSN: 00318949     EISSN: 14024896     Source Type: Journal    
DOI: 10.1088/0031-8949/76/5/028     Document Type: Article

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