Fast-ion-beam laser-induced-fluorescence measurements of spontaneous-emission branching ratios and oscillator strengths in Sm II

Canadian Journal of Physics

Volumn 84, Issue 8, 2006, Pages 723-771

  Rehse, S J ^a   Li, R ^a   Scholl, T J ^a   Sharikova, A ^a   Chatelain, R ^a   Holt, R A ^a   Rosner, S D ^a  

^a UNIVERSITY OF WESTERN ONTARIO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

FLUORESCENCE; ION BEAMS; LASER APPLICATIONS; OSCILLATORS (ELECTRONIC);

BRANCHING RATIOS; LASER EXCITATION; LASER-INDUCED-FLUORESCENCE MEASUREMENTS;

SPONTANEOUS EMISSION;

EID: 33845997745     PISSN: 00084204     EISSN: None     Source Type: Journal    
DOI: 10.1139/P06-063     Document Type: Article

References (4)

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2. A.2. Y. Sun and J. Yuan. Phys. Rev. B, 71, 125109-1 (2005).
3. A.3. I.J. Lowe. Phys. Rev. Lett. 2, 285 (1959).
4. A.4. L.J. Kaufman, J. Heo, L.D. Ziegler, and G.R. Fleming. Phys. Rev. Lett. 88, 207402-1 (2002).