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Volumn 40, Issue 23, 2007, Pages 4537-4550

Electron-impact excitation of Ar+: An improved determination of Ar impurity influx in tokamaks

Author keywords

[No Author keywords available]

Indexed keywords

ARGON; COMPUTER SIMULATION; ELECTRIC EXCITATION; ELECTRONS; MAGNETOPLASMA; SCATTERING;

EID: 36248990326     PISSN: 09534075     EISSN: 13616455     Source Type: Journal    
DOI: 10.1088/0953-4075/40/23/013     Document Type: Article
Times cited : (17)

References (28)
  • 17
    • 36248950876 scopus 로고    scopus 로고
    • http://vanadium.rollins.edu/GASP/GASP.html
  • 19
    • 36249001480 scopus 로고    scopus 로고
    • http://physics.nist.gov/PhysRefData/ASD/index.html
  • 22
    • 36248960334 scopus 로고    scopus 로고
    • http://www.vuse.vanderbilt.edu/∼cff/mchf_collection


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.