Electron-impact excitation and ionization of Ar+ for the determination of impurity influx in tokamaks

Journal of Physics B: Atomic, Molecular and Optical Physics

Volumn 30, Issue 15, 1997, Pages 3543-3565

  Griffin, D C ^a   Pindzola, M S ^b   Shaw, J A ^b   Badnell, N R ^c   O'Mullane, M ^d   Summers, H P ^c  

^a ROLLINS COLLEGE   (United States)

^b AUBURN UNIVERSITY   (United States)

^c UNIVERSITY OF STRATHCLYDE   (United Kingdom)

^d CULHAM SCIENCE CENTRE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ARGON; CARRIER CONCENTRATION; ELECTRON ENERGY LEVELS; IMPURITIES; IONIZATION; NUMERICAL METHODS; TOKAMAK DEVICES;

COLLISIONAL RADIATIVE MODELLING; ELECTRON IMPACT EXCITATION; IMPURITY INPLUX;

ELECTRON SCATTERING;

EID: 0000961706     PISSN: 09534075     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-4075/30/15/023     Document Type: Article

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