Adaptive mesh computation of polycrystalline pattern formation using a renormalization-group reduction of the phase-field crystal model

Physical Review E - Statistical, Nonlinear, and Soft Matter Physics

Volumn 76, Issue 5, 2007, Pages

  Athreya, Badrinarayan P ^a   Goldenfeld, Nigel ^b   Dantzig, Jonathan A ^a   Greenwood, Michael ^c   Provatas, Nikolas ^c  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

^b University of Illinois at Urbana Champaign   (United States)

^c MCMASTER UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; GRAIN BOUNDARIES; GRAIN GROWTH; POLYCRYSTALLINE MATERIALS; TOPOLOGY;

ATOMIC DENSITY FIELDS; PHASE FIELD CRYSTAL MODELS; POLYCRYSTALLINE PATTERN FORMATION; TOPOLOGICAL DEFECTS;

ADAPTIVE ALGORITHMS;

EID: 36248978164     PISSN: 15393755     EISSN: 15502376     Source Type: Journal    
DOI: 10.1103/PhysRevE.76.056706     Document Type: Article

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