-
2
-
-
33750389797
-
Asphärenprüfung mit computergenerierten Hologrammen
-
S. Reichelt, and H. Tiziani, "Asphärenprüfung mit computergenerierten Hologrammen," Technisches Messen 73, pp. 554-565, 2006.
-
(2006)
Technisches Messen
, vol.73
, pp. 554-565
-
-
Reichelt, S.1
Tiziani, H.2
-
3
-
-
0033096881
-
Absolute measurement of non-comatic aspheric surface errors
-
Mar
-
R. Freimann, B. Dörband, and F. Höller, "Absolute measurement of non-comatic aspheric surface errors," Optics Communications 161, pp. 106-114, Mar. 1999.
-
(1999)
Optics Communications
, vol.161
, pp. 106-114
-
-
Freimann, R.1
Dörband, B.2
Höller, F.3
-
4
-
-
33749424525
-
Three-flat test solutions based on simple mirror symmetry
-
Aug
-
U. Griesmann, "Three-flat test solutions based on simple mirror symmetry," Applied Optics 45, pp. 5856-5865, Aug. 2006.
-
(2006)
Applied Optics
, vol.45
, pp. 5856-5865
-
-
Griesmann, U.1
-
5
-
-
0036576059
-
Dual-wave-front computer-generated holograms for quasiabsolute testing of aspherics
-
May
-
M. Beyerlein, N. Lindlein, and J. Schwider, "Dual-wave-front computer-generated holograms for quasiabsolute testing of aspherics," Applied Optics 41, pp. 2440-2447, May 2002.
-
(2002)
Applied Optics
, vol.41
, pp. 2440-2447
-
-
Beyerlein, M.1
Lindlein, N.2
Schwider, J.3
-
6
-
-
0037695195
-
Twin-CGHs for absolute calibration in wavefront testing interferometry
-
May
-
S. Reichelt and H. J. Tiziani, "Twin-CGHs for absolute calibration in wavefront testing interferometry," Optics Communications 220, pp. 23-32, May 2003.
-
(2003)
Optics Communications
, vol.220
, pp. 23-32
-
-
Reichelt, S.1
Tiziani, H.J.2
-
7
-
-
1942510508
-
-
S. Reichelt, C. Pruss, and H. J. Tiziani, Absolute testing of aspheric surfaces, in Optical Fabrication, Testing, and Metrology. Edited by Geyl, Roland; Rimmer, David; Wang, Lingli. Proceedings of the SPIE, 5252, pp. 252-263 (2004)., R. Geyl, D. Rimmer, and L. Wang, eds., pp. 252-263, Feb. 2004.
-
S. Reichelt, C. Pruss, and H. J. Tiziani, "Absolute testing of aspheric surfaces," in Optical Fabrication, Testing, and Metrology. Edited by Geyl, Roland; Rimmer, David; Wang, Lingli. Proceedings of the SPIE, Volume 5252, pp. 252-263 (2004)., R. Geyl, D. Rimmer, and L. Wang, eds., pp. 252-263, Feb. 2004.
-
-
-
-
8
-
-
33846546120
-
Quasi-absolute measurement of aspheres with a combined diffractive optical element as reference
-
F. Simon, G. Khan, K. Mantel, N. Lindlein, and J. Schwider, "Quasi-absolute measurement of aspheres with a combined diffractive optical element as reference.," Applied Optics 45(34), pp. 8606-12, 2006.
-
(2006)
Applied Optics
, vol.45
, Issue.34
, pp. 8606-8612
-
-
Simon, F.1
Khan, G.2
Mantel, K.3
Lindlein, N.4
Schwider, J.5
-
9
-
-
0038527372
-
Microstitching interferometry for x-ray reflective optics
-
May
-
K. Yamauchi, K. Yamamura, H. Mimura, Y. Sano, A. Saito, K. Ueno, K. Endo, A. Souvorov, M. Yabashi, K. Tamasaku, T. Ishikawa, and Y. Mori, "Microstitching interferometry for x-ray reflective optics," Review of Scientific Instruments 74, pp. 2894-2898, May 2003.
-
(2003)
Review of Scientific Instruments
, vol.74
, pp. 2894-2898
-
-
Yamauchi, K.1
Yamamura, K.2
Mimura, H.3
Sano, Y.4
Saito, A.5
Ueno, K.6
Endo, K.7
Souvorov, A.8
Yabashi, M.9
Tamasaku, K.10
Ishikawa, T.11
Mori, Y.12
-
10
-
-
17444452388
-
System of four distance sensors for high-accuracy measurement of topography
-
I. Weingärtner and C. Elster, "System of four distance sensors for high-accuracy measurement of topography," Precision Engineering 28, pp. 164-170, 2004.
-
(2004)
Precision Engineering
, vol.28
, pp. 164-170
-
-
Weingärtner, I.1
Elster, C.2
-
11
-
-
27844534773
-
Coupled distance sensor systems for high-accuracy topography measurement: Accounting for scanning stage and systematic sensor errors
-
C. Elster, I. Weingärtner, and M. Schulz, "Coupled distance sensor systems for high-accuracy topography measurement: Accounting for scanning stage and systematic sensor errors," Precision Engineering 30, pp. 32-38, 2006.
-
(2006)
Precision Engineering
, vol.30
, pp. 32-38
-
-
Elster, C.1
Weingärtner, I.2
Schulz, M.3
-
12
-
-
36249027777
-
-
M. Schulz, J. Gerhardt, R. D. Geckeier, and C. Elster, Traceable multiple sensor system for absolute form measurement, in Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II. Edited by Duparre, Angela; Singh, Bhanwar; Gu, Zu-Han. Proceedings of the SPIE, 5878, pp. 84-91 (2005)., A. Duparre, B. Singh, and Z.-H. Gu, eds., pp. 84-91, Aug. 2005.
-
M. Schulz, J. Gerhardt, R. D. Geckeier, and C. Elster, "Traceable multiple sensor system for absolute form measurement," in Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II. Edited by Duparre, Angela; Singh, Bhanwar; Gu, Zu-Han. Proceedings of the SPIE, Volume 5878, pp. 84-91 (2005)., A. Duparre, B. Singh, and Z.-H. Gu, eds., pp. 84-91, Aug. 2005.
-
-
-
-
13
-
-
0004161838
-
-
Cambridge University Press, October
-
W. H. Press, B. P. Flannery, S. A. Teukolsky, and W. T. Vetterling, Numerical Recipes in C : The Art of Scientific Computing, Cambridge University Press, October 1992.
-
(1992)
Numerical Recipes in C : The Art of Scientific Computing
-
-
Press, W.H.1
Flannery, B.P.2
Teukolsky, S.A.3
Vetterling, W.T.4
|