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Volumn 20, Issue 4, 1997, Pages 278-287

Design of due date assignment model and the determination of flow time control parameters for the wafer fabrication factories

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CONSTRAINT THEORY; DATA REDUCTION; FABRICATION; MATHEMATICAL MODELS; PERFORMANCE; TIME MEASUREMENT;

EID: 0031246943     PISSN: 10834400     EISSN: None     Source Type: Journal    
DOI: 10.1109/3476.650959     Document Type: Article
Times cited : (34)

References (17)
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  • 3
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    • C. Lozinski C. R. Glassey Bottleneck starvation indicators for shop floor control IEEE Trans. Semiconduct. Manufact. 1 147 153 Nov. 1988 66 660 17988
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    • G. Zapfel H. Missbauer New concept for production planning and control Euro. J. Operat. Res. 67 297 320 1993
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    • Zapfel, G.1    Missbauer, H.2
  • 5
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    • M. L. Smith A. Seidman Due date selection procedure for job-shop simulation Comput. Ind. Eng. 7 3 199 207 1983
    • (1983) , vol.7 , Issue.3 , pp. 199-207
    • Smith, M.L.1    Seidman, A.2
  • 6
    • 0026186620 scopus 로고
    • M. M. Vig K. J. Dooley Dynamic rules for due-date assignment Int. J. Prod. Res. 29 7 1361 1377 1991
    • (1991) , vol.29 , Issue.7 , pp. 1361-1377
    • Vig, M.M.1    Dooley, K.J.2
  • 7
    • 0018454859 scopus 로고
    • J. K. Weeks A simulation study of predictable due-dates Manage Sci. 25 4 363 373 1979
    • (1979) , vol.25 , Issue.4 , pp. 363-373
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  • 8
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    • A. C. Kaplan A. T. Urnal A probabilistic cost-based due date assignment model for job shops Int. J. Prod. Res. 31 12 2817 2834 1993
    • (1993) , vol.31 , Issue.12 , pp. 2817-2834
    • Kaplan, A.C.1    Urnal, A.T.2
  • 9
    • 0027657253 scopus 로고
    • S. T. Enns Job shop flow time prediction and tardiness control using queueing analysis Int. J. Prod. Res. 31 9 2045 2057 1993
    • (1993) , vol.31 , Issue.9 , pp. 2045-2057
    • Enns, S.T.1
  • 10
    • 85176667211 scopus 로고
    • T. C. E. Chen M. C. Gupta Survey of scheduling research involving due date determining decisions Eur. J. Oper. Res. 38 156 166 1989
    • (1989) , vol.38 , pp. 156-166
    • Chen, T.C.E.1    Gupta, M.C.2
  • 11
    • 85176690722 scopus 로고    scopus 로고
    • H. Yan S. Lou S. Sethi A. Gardel P. Deosthali Testing the robustness of two-boundary control policies in semiconductor manufacturing IEEE Trans. Semiconduct. Manufact. 9 1 24 Feb. 1996 66 10608 492825
    • (1996) , vol.9 , pp. 1-24
    • Yan, H.1    Lou, S.2    Sethi, S.3    Gardel, A.4    Deosthali, P.5
  • 12
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    • South-Western OH, Cincinnati
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    • CRC New York
    • J. H. Dshalalow Advances in Queueing: Theory, Methods, and Open Problems 1995 CRC New York
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    • J. R. May S. H. Chung The design of dispatching rule for the primary machines of wafer fabrication factories 1996 M.S. thesis Taiwan, R.O.C., Hsinchu
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.