Integrated colour detectors in 0.18m CMOS technology

Electronics Letters

Volumn 43, Issue 23, 2007, Pages 1279-1281

  Yang, F ^a   Titus, A H ^a  

^a State University of New York   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION GRATINGS; PHOTODETECTORS; SPECTRUM ANALYSIS;

JUNCTION DETECTORS; METALLIC GRIDS; SPECTRAL SENSITIVITY;

CMOS INTEGRATED CIRCUITS;

EID: 36049031545     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:20071741     Document Type: Article

References (9)

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8. Catrysse, P., Wandell, B., and El Gamal, A.: ' An integrated color pixel in 0.18m CMOS technology ', IEEE Int. Electron Devices Meet. (IEDM) 2001, 2001, p. 559
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