Conductance of rough random profiles

International Journal of Solids and Structures

Volumn 45, Issue 3-4, 2008, Pages 879-893

  Ciavarella, M ^a   Dibello, S ^a   Demelio, G ^a  

^a POLITECNICO DI BARI   (Italy)

Author keywords

Electrical contact; Electrical resistance; Rough contact; Roughness

Indexed keywords

ELASTIC DEFORMATION; ELECTRIC CONTACTORS; ELECTRIC RESISTANCE; RANDOM PROCESSES; STRESS ANALYSIS; WAVELENGTH;

RANDOM PHASES; RANDOM PROFILES; ROUGH CONTACT;

SURFACE ROUGHNESS;

EID: 36049030704     PISSN: 00207683     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijsolstr.2007.09.009     Document Type: Article

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