Spin noise spectroscopy in semiconductors

Review of Scientific Instruments

Volumn 78, Issue 10, 2007, Pages

  Romer M ^a   Hubner J ^a   Oestreich, M ^a  

^a LEIBNIZ UNIVERSITY HANNOVER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONS; OPTIMIZATION; PERTURBATION TECHNIQUES; SEMICONDUCTOR MATERIALS; SPIN DYNAMICS;

LASER PROBE; SPIN NOISE SPECTROSCOPY; SPIN RELAXATION; THERMAL EQUILIBRIUM;

SPURIOUS SIGNAL NOISE;

ARTICLE; EQUIPMENT; EQUIPMENT DESIGN; INSTRUMENTATION; METHODOLOGY; REPRODUCIBILITY; SEMICONDUCTOR; SENSITIVITY AND SPECIFICITY; SPECTROSCOPY; SPIN LABELING;

EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; REPRODUCIBILITY OF RESULTS; SEMICONDUCTORS; SENSITIVITY AND SPECIFICITY; SPECTRUM ANALYSIS; SPIN LABELS;

EID: 36049019368     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2794059     Document Type: Article

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