Outlier detection in two-stage semiparametric DEA models

European Journal of Operational Research

Volumn 187, Issue 2, 2008, Pages 629-635

  Johnson, Andrew L ^a   McGinnis, Leon F ^b  

^a Texas A and M University   (United States)

^b Georgia Institute of Technology   (United States)

Author keywords

Data envelopment analysis; Inefficient frontier; Outlier detection; Productivity

Indexed keywords

DATA REDUCTION; ITERATIVE METHODS; MATHEMATICAL MODELS; PARAMETER ESTIMATION;

INEFFICIENT FRONTIER; NONPARAMETRIC ANALYSIS; OUTLIER DETECTION;

DATA ENVELOPMENT ANALYSIS;

EID: 36049016676     PISSN: 03772217     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ejor.2007.03.041     Document Type: Article

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