Using DEA and worst practice DEA in credit risk evaluation

Journal of Productivity Analysis

Volumn 21, Issue 2, 2004, Pages 153-165

  Paradi, Joseph C ^a   Asmild, Mette ^a   Simak, Paul C ^b  

^a UNIVERSITY OF TORONTO   (Canada)

^b MCKINSEY AND COMPANY   (United States)

Author keywords

Credit risk; Data envelopment analysis; Layering or peeling technique; Worst practice DEA

Indexed keywords

EID: 3843113429     PISSN: 0895562X     EISSN: None     Source Type: Journal    
DOI: 10.1023/B:PROD.0000016870.47060.0b     Document Type: Article

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