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Volumn , Issue , 2006, Pages 2121-2126

An SVM approach to crack shape reconstruction in eddy current testing

Author keywords

Eddy current testing; Nondestructive testing; Signal processing; Support vector machine

Indexed keywords

DEFECTS; EDDY CURRENT TESTING; SIGNAL PROCESSING;

EID: 36049003644     PISSN: 10915281     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IMTC.2006.236815     Document Type: Conference Paper
Times cited : (17)

References (22)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.