메뉴 건너뛰기




Volumn 42, Issue , 2004, Pages 397-461

Chapter 9 Secondary ion mass spectrometry. Application to archaeology and art objects

Author keywords

[No Author keywords available]

Indexed keywords


EID: 36049000120     PISSN: 0166526X     EISSN: None     Source Type: Book Series    
DOI: 10.1016/S0166-526X(04)80013-8     Document Type: Article
Times cited : (11)

References (66)
  • 1
    • 66249097136 scopus 로고
    • Doctorate of Science, New York
    • Slodzian G. Thesis (1963), Doctorate of Science, New York
    • (1963) Thesis
    • Slodzian, G.1
  • 7
    • 0003867807 scopus 로고
    • 9 pp. Behrish R. (Ed), Springer, Sophia-Antipolis, France
    • 9 pp. Sigmund P. In: Behrish R. (Ed). Sputtering by Particle Bombardment I. Topics in Applied Physics Vol. 47 (1981), Springer, Sophia-Antipolis, France
    • (1981) Topics in Applied Physics , vol.47
    • Sigmund, P.1
  • 8
    • 0004011391 scopus 로고
    • 145 pp. Behrish R. (Ed), Springer, Berlin
    • 145 pp. Andersen H.H., and Bay H.I. In: Behrish R. (Ed). Sputtering by Particle Bombardment I. Topics in Applied Physics Vol. 47 (1981), Springer, Berlin
    • (1981) Topics in Applied Physics , vol.47
    • Andersen, H.H.1    Bay, H.I.2
  • 10
    • 66249121498 scopus 로고
    • Eléments de choix d'une méthode de microanalyse. Analyse des surfaces et des couches minces
    • P 3 795, Paris
    • P 3 795, Paris. Blaise G. Eléments de choix d'une méthode de microanalyse. Analyse des surfaces et des couches minces. Les Techniques de I'Ingénieur (1990)
    • (1990) Les Techniques de I'Ingénieur
    • Blaise, G.1
  • 20
    • 66249130149 scopus 로고    scopus 로고
    • Documents kindly provided by the CAMECA company
    • Documents kindly provided by the CAMECA company, Courbevoie, 1997.
    • (1997) Courbevoie
  • 21
    • 66249112931 scopus 로고    scopus 로고
    • Documents provided by Physical Electronics company, Cachan
    • Documents provided by Physical Electronics company, Cachan, 1996.
    • (1996)
  • 24
    • 0039652901 scopus 로고
    • Thin films and depth profile analysis
    • 63 pp. Oechsner H. (Ed), Springer, New York
    • 63 pp. Oechsner H. Thin films and depth profile analysis. In: Oechsner H. (Ed). Topics in Applied Physics Vol. 37 (1984), Springer, New York
    • (1984) Topics in Applied Physics , vol.37
    • Oechsner, H.1
  • 35
    • 66249084260 scopus 로고
    • INPL Nancy, New York
    • Marie Y. Thesis (1995), INPL Nancy, New York
    • (1995) Thesis
    • Marie, Y.1
  • 36
    • 66249111948 scopus 로고
    • Doctorate of Science, Besançon
    • Darque-Ceretti E. Thesis (1986), Doctorate of Science, Besançon
    • (1986) Thesis
    • Darque-Ceretti, E.1
  • 40
    • 0347781041 scopus 로고    scopus 로고
    • 180 pp. Creagh D.C., and Bradley D.A. (Eds), Elsevier, Chichester
    • 180 pp. Adriaens A. In: Creagh D.C., and Bradley D.A. (Eds). Radiation in Art and Archaeometry (2000), Elsevier, Chichester
    • (2000) Radiation in Art and Archaeometry
    • Adriaens, A.1
  • 42
    • 66249143136 scopus 로고
    • Benninghoven A., Nihei Y., Shimizu R., and Werner H.W. (Eds), Wiley, Amsterdam
    • Holliger P. In: Benninghoven A., Nihei Y., Shimizu R., and Werner H.W. (Eds). Secondary Ion Mass Spectrometry, SIMS IX (1994), Wiley, Amsterdam 906
    • (1994) Secondary Ion Mass Spectrometry, SIMS IX , pp. 906
    • Holliger, P.1
  • 58
    • 0344388687 scopus 로고    scopus 로고
    • Microscopic analysis of Roman vessel glass
    • University of Antwerp, Götegorg
    • Aerts A. Microscopic analysis of Roman vessel glass. Dissertation (1998), University of Antwerp, Götegorg
    • (1998) Dissertation
    • Aerts, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.