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Volumn 19, Issue 45, 2007, Pages
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Determination of 'bisotropic' stresses in layered semiconductor structures from Raman light scattering data
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTALS;
ELASTIC CONSTANTS;
FREQUENCY SHIFT KEYING;
PHONONS;
RAMAN SCATTERING;
BISOTROPIC STRESSES;
EXPLICIT EXPRESSIONS;
RAMAN SHIFTS;
UNIAXIAL DEFORMATIONS;
SEMICONDUCTOR DEVICES;
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EID: 36048979054
PISSN: 09538984
EISSN: 1361648X
Source Type: Journal
DOI: 10.1088/0953-8984/19/45/456219 Document Type: Conference Paper |
Times cited : (2)
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References (12)
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