메뉴 건너뛰기




Volumn 19, Issue 45, 2007, Pages

Determination of 'bisotropic' stresses in layered semiconductor structures from Raman light scattering data

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALS; ELASTIC CONSTANTS; FREQUENCY SHIFT KEYING; PHONONS; RAMAN SCATTERING;

EID: 36048979054     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/19/45/456219     Document Type: Conference Paper
Times cited : (2)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.