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Volumn 401-402, Issue , 2007, Pages 662-665

Development of the 8Li cross-relaxation technique: Applications in semiconductors and other condensed matter systems

Author keywords

Detected NMR; Cross relaxation; Lithium; Site; Structure

Indexed keywords

CONDENSED MATTER PHYSICS; IMPURITIES; ISOTOPES; NUCLEAR MAGNETIC RESONANCE; SEMICONDUCTOR MATERIALS;

EID: 36048968526     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2007.09.046     Document Type: Article
Times cited : (6)

References (36)
  • 23
    • 77956710831 scopus 로고    scopus 로고
    • Identification of defects in semiconductors
    • Stavola M. (Ed), Academic Press, New York
    • Chow K.H., Hitti B., and Kiefl R.F. Identification of defects in semiconductors. In: Stavola M. (Ed). Semiconductors and Semimetals vol. 51A (1998), Academic Press, New York 137
    • (1998) Semiconductors and Semimetals , vol.51 A , pp. 137
    • Chow, K.H.1    Hitti, B.2    Kiefl, R.F.3
  • 36
    • 36049032716 scopus 로고    scopus 로고
    • Oshumi F., et al. Hyp. Int. 120 (1999) 419
    • (1999) Hyp. Int. , vol.120 , pp. 419
    • Oshumi, F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.