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Volumn 73, Issue 11, 2006, Pages

Demonstration of the effect of uniaxial stress on the electronic structure of bond-centered muonium in Si

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EID: 33645471187     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.73.113202     Document Type: Article
Times cited : (12)

References (27)
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