Fast ADC testing by repetitive histogram analysis

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn , Issue , 2006, Pages 1633-1638

  Serra, Antonio Cruz ^a   Alegria, Francisco ^a   Michaeli, Linus ^b   Michalko, Peter ^b   Šaliga, Jan ^b  

^a UNIVERSITY OF LISBON   (Portugal)

^b TECHNICAL UNIVERSITY OF KO ICE   (Slovakia)

Author keywords

ADC modeling; ADCTesting

Indexed keywords

ELECTRIC FREQUENCY CONTROL; ERROR ANALYSIS; ONE DIMENSIONAL; PARAMETER ESTIMATION; STOCHASTIC CONTROL SYSTEMS;

BAND HISTOGRAM; CODE FREQUENCY TESTING; HARMONIC SIGNALS; SINUSOIDAL STIMULUS;

ANALOG TO DIGITAL CONVERSION;

EID: 36048965820     PISSN: 10915281     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IMTC.2006.237120     Document Type: Conference Paper

References (8)

1. Michaeli, L., Michalko, P.,Šaliga,J.: "Identification of ADC Error Model by Testing of the Chosen Code Bins ", Proc.of 12th IMEKO TC4 Intemational Symposium. September 25-27, 2002, Zagreb, Croatia, pp.
2. Vargha, B., Zoltan, I: "Calibration Algorithm for Current - output R-2R Ladders", IEEE Trans.on Instrumentation and Measurement, Vol 50., No.5., pp.1216-1220. October 2001,ISSN 0018-9456
3. Cruz Serra, A., Fonseca da Silva, M., Ramos, P., Michaeli,L.., Šaliga,J.: Combined Spectral and Histogram Analysis for Fast ADC Testing,IEEE Trans.on Instrumentation and Measurement" Vol. 54.August 2005, pp.1617-1613
4. Michaeli,L.,Michalko,P.,Šatiga,J.: Identification of Unified ADC Error Model by Triangular Testing Signal, Proceedings of the IMEKO 14 th Int.Symposium and 10 th Workshop on ADC Modelling and Testing, Gdynia, Poland,Sept.2005, Vol. II. Pp.605-610.
5. Stefani,F, Moschitta,A., Macii,D., Carbone,P., Petri,D.: Fast Estimation of A/D Converter Nonlinearities, IWADC '2004,Proceedings, Athens Sept.2004 pp.841-845.
6. Attivissimo, F., Giaquinto, N., Savino, M.: "FFT Test of ADC Converters to Determine the Integral Nonlinearity", IEEE Trans.on Instrumentation and Measurement, Vol 51., No.5., pp.1050-1.054. October 2002, ISSN 0018-9456.
7. IEEE Std. 1241 - 2000, "IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters," Institute of Electrical and Electronics Engineers, Inc. New York, USA 2000, IEEE Standards
8. European project DYNAD.: "Methods and Draft Standards for the Dynamic Characterization and Testing of Analog-to-Digital Converters", published on web at: htpp://www.fe.up.pt/~hsm/dynad