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Volumn 46, Issue 11, 2007, Pages 7396-7398

Atomistic process of twin-boundary migration induced by shear deformation in gold

Author keywords

In situ transmission electron microscopy; Migration; Nanocontact; Sliding; Twin boundary

Indexed keywords

IN SITU PROCESSING; NANOSTRUCTURED MATERIALS; SHEAR DEFORMATION; TRANSMISSION ELECTRON MICROSCOPY;

EID: 35949002473     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.46.7396     Document Type: Article
Times cited : (11)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.