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Volumn 63, Issue 11, 2007, Pages
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Refinement of the layered titanosilicate AM-1 from single-crystal X-ray diffraction data
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Author keywords
[No Author keywords available]
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Indexed keywords
TETRA;
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EID: 35948987543
PISSN: 16005368
EISSN: 16005368
Source Type: Journal
DOI: 10.1107/S160053680704812X Document Type: Article |
Times cited : (16)
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References (10)
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