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Volumn 63, Issue 11, 2007, Pages

Refinement of the layered titanosilicate AM-1 from single-crystal X-ray diffraction data

Author keywords

[No Author keywords available]

Indexed keywords

TETRA;

EID: 35948987543     PISSN: 16005368     EISSN: 16005368     Source Type: Journal    
DOI: 10.1107/S160053680704812X     Document Type: Article
Times cited : (16)

References (10)
  • 2
    • 35948981695 scopus 로고    scopus 로고
    • Brandenburg, K, 2006, DIAMOND. Version 3.1d. Crystal Impact GbR, Bonn, Germany
    • Brandenburg, K. (2006). DIAMOND. Version 3.1d. Crystal Impact GbR, Bonn, Germany.
  • 7
    • 0004182772 scopus 로고    scopus 로고
    • Nonius BV, Delft, The Netherlands
    • Nonius (2003). COLLECT. Nonius BV, Delft, The Netherlands.
    • (2003) COLLECT
    • Nonius1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.