Display reflectance: Basics, measurement, and rating

Journal of the Society for Information Display

Volumn 14, Issue 11, 2006, Pages 1003-1017

  Becker, Michael E ^a  

^a Display Metrology and Systems   (Germany)

Author keywords

BRDF; BSDF; Contrast under ambient illumination; Display reflectance and evaluation; Ergonomic performance evaluation; Glare; Haze; Instrument signature; ISO9241 7; Multilayer stacks; Point source illumination; PSF; Reference standards; Scattering

Indexed keywords

COMPUTATIONAL GEOMETRY; COMPUTER APPLICATIONS; COMPUTER GRAPHICS; ELECTROMAGNETIC WAVES; LIGHTING; RAY TRACING; REFLECTION;

BRDF; BSDF; CONTRAST UNDER AMBIENT ILLUMINATION; DISPLAY REFLECTANCE AND EVALUATION; ERGONOMIC PERFORMANCE EVALUATION; HAZE; ISO9241-7; MULTILAYER STACKS; POINT-SOURCE ILLUMINATION; PSF; REFERENCE STANDARDS;

FLUORESCENT SCREENS;

EID: 35948931992     PISSN: 10710922     EISSN: None     Source Type: Journal    
DOI: 10.1889/1.2393025     Document Type: Article

References (23)

1. ASTM Standards on Color & Appearance Measurement.
2. ISO9241-7 Ergonomic Requirements for Office Work with Visual Display Terminals (VDTs), Part 7: Requirements for Displays with Reflections.
3. ISO13406-2 Ergonomie Requirements for Work with Visual Displays Based on Flat Panels. Part 2: Ergonomic Requirements for Flat Panel Displays, publication date Dec 1, 2001.
4. E F Kelley and G R Jones, "Utilizing the BRDF to predict reflections from FPDs," SID Symposium Digest Tech Papers 28, 831 (1997).
5. M E Becker, "Evaluation and characterization of display reflectance," SID Symposium Digest Tech Papers 28, 827 (1997).
6. S Kubota, "Measurement of specular reflectance of LCDs," Proc Intl Symp Ilium Eng Soc Jpn, 241 (1994).
7. CIE No. 38-1977, Radiometric and photometric characteristics of materials and their measurement, CIE No. 44-1979: Absolute methods for reflection measurements, CIE No. 17.4-1987: International lighting vocabulary, 4th ed. (Joint publication IEC/CIE).
8. J C Stover, Optical Scattering, Measurement and Analysis (SPIE Press, 1995).
9. M E Becker, "Evaluation and characterization of display reflectance," Displays 19, 35 (1998).
10. http://en.wikipedia.org/wiki/deconvolution.
11. M E Becker, "Measurement of display scattering," Proc 22nd IDRC, 803 (2002).
12. http://www.ise.fhg.de/radiance/gonio-photometer/intro.html.
13. E F Kelley, "Sensitivity of display reflection measurements to apparatus geometry," SID Symposium Digest Tech Papers 33, 140 (2002).
14. A M Nuijs and J J L Horikx, "Diffraction and scattering at antiglare structures for display devices," Appl Opt 33, No. 18, 4058-4068 (1994).
15. E F Kelley, "FPD measurements and standards," SID Application Tutorials 2001, Slide No. 79.
16. M E Becker, "Measurement and evaluation of display scattering," J Soc Info Display 13/1, 81-89 (2005).
17. F E Nicodemus et al, "Geometric considerations and nomenclature for reflectance," U.S. Dept. of Commerce, NBS Monograph 160 (1977).
18. E Marx, "Computation of light scattered into a detector," NIST, Gaithersburg, MD.
19. www.labsphere.com.
20. http://physics.nist.gov/Divisions/Div844/facilities/ref/rc.html.
21. H Li et al, "Automated three-axis goniometer ...," www.graphics.cornell.edu/~westin/SPIE_587S-29_Gonio.pdf.
22. H-J Herrmann, TUV Rheinland, Product Safety GmbH (private communication, 2006) (this is highly appreciated!)
23. M Becker, "Metrology issues for LCD-TV" Displays 26, Nos. 4 and 5, 197-207 (2005).