Measurement of display scattering

SID Conference Record of the International Display Research Conference

Volumn , Issue , 2002, Pages 803-806

  Becker, Michael E ^a  

^a Display Metrology and Systems   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT REFLECTION; LIGHT SCATTERING; LIGHTING; PHOTOMETERS; SCANNING;

SOURCE APERTURES;

DISPLAY DEVICES;

EID: 0036459744     PISSN: 10831312     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

1. M.E. Becker: "Evaluation and Characterization of Display Reflectance", SID '97 Digest, pp. 827.
2. E.F. Kelley, G.R. Jones: "Utilizing the BRDF to predict reflections from FPDs", SID '97 Digest, pp. 831.
3. A.M. Nuijs, J.J.L. Horikx: "Diffraction and scattering at antiglare structures for display devices", Applied Optics, 33, 18 (1994), pp. 4058.
4. M.E. Becker: "Evaluation and Characterization of Display Reflectance", Displays 19 (1998), pp. 35-54.
5. S. Kubota: "Measurement of specular reflectance of LCDs", Proc. Int. Symp. Illum. Engineering Soc. Jpn., (1994), p. 241.
6. ASTM Standards on Color and Appearance, E 430.
7. M.E. Becker: "Viewing-cone Analysis of LCDs: a Comparison of Measuring Methods" SID 1996, pp. 199.
8. E.F. Kelley: "Fundamentals of Display Metrology", SID Short Courses 2002.