Study of bulk and interface defects in silicon oxide with X-ray absorption spectroscopy

Materials Science and Engineering: B

Volumn 144, Issue 1-3, 2007, Pages 23-26

  Tallarida, Massimo ^a   Schmeisser, Dieter ^a  

^a BRANDENBURG UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

Defects; Silicon oxide; X ray absorption

Indexed keywords

ABSORPTION; DEFECTS; INTERFACES (MATERIALS); LARGE SCALE SYSTEMS; X RAY SPECTROSCOPY;

BULK DEFECTS; INTERFACE DEFECTS; NATIVE OXIDES;

SILICA;

EID: 35748984641     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2007.07.077     Document Type: Article

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