Correction to Koen's critical values in testing spatial randomness

Journal of Statistical Computation and Simulation

Volumn 77, Issue 11, 2007, Pages 1001-1004

  Chiu, Sung Nok ^a  

^a HONG KONG BAPTIST UNIVERSITY   (Hong Kong)

Author keywords

Complete spatial randomness; Spatial point patterns

Indexed keywords

EID: 35648947937     PISSN: 00949655     EISSN: 15635163     Source Type: Journal    
DOI: 10.1080/10629360600989147     Document Type: Article

References (13)

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13. Diggle, P.J., 1979, On parameter estimation and goodness-of-fit testing for spatial point patterns. Biometrics, 35, 87-101.