Testing the complete spatial randomness by Diggle's test without an arbitrary upper limit

Journal of Statistical Computation and Simulation

Volumn 76, Issue 7, 2006, Pages 585-591

  Ho, L ^a   Chiu, S ^a  

^a HONG KONG BAPTIST UNIVERSITY   (Hong Kong)

Author keywords

Complete spatial randomness; Edge correction; Intensity estimator; K function; Spatial point pattern

Indexed keywords

EID: 33646538104     PISSN: 00949655     EISSN: 15635163     Source Type: Journal    
DOI: 10.1080/00949650412331321043     Document Type: Article

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