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Volumn 6536, Issue , 2007, Pages

Comparing Low Coherence Interferometry with conventional methods of measuring paper roughness

Author keywords

Non contact; Optical; Profilometry

Indexed keywords

COHERENT LIGHT; INTERFEROMETRY; OPTICAL PROPERTIES; PROFILOMETRY;

EID: 35648942710     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.753459     Document Type: Conference Paper
Times cited : (3)

References (6)
  • 1
    • 35648986871 scopus 로고    scopus 로고
    • Niskanen K 1998 Paper Physics (Finland, Gummerus Printing)
    • Niskanen K 1998 Paper Physics (Finland, Gummerus Printing)
  • 3
    • 10044286110 scopus 로고    scopus 로고
    • Optical coherence tomography device for paper characterization
    • E. Alarousu, L. Krehut, R. Myllylä and J. Hast, "Optical coherence tomography device for paper characterization", Proc. SPIE 5475, 48-55 (2003).
    • (2003) Proc. SPIE , vol.5475 , pp. 48-55
    • Alarousu, E.1    Krehut, L.2    Myllylä, R.3    Hast, J.4
  • 4
    • 24344478761 scopus 로고    scopus 로고
    • Study on the use of optical coherence tomography in measurements of paper properties
    • E. Alarousu, L. Krehut, T. Prykäri and R. Myllylä, "Study on the use of optical coherence tomography in measurements of paper properties", Meas. Sci. Technol. 16, 1131-1137 (2005).
    • (2005) Meas. Sci. Technol , vol.16 , pp. 1131-1137
    • Alarousu, E.1    Krehut, L.2    Prykäri, T.3    Myllylä, R.4
  • 5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.