Electronic prognostics for switched mode power supplies

Microelectronics Reliability

Volumn 47, Issue 12, 2007, Pages 1902-1906

  Goodman, Douglas ^a   Hofmeister, James ^a   Judkins, Justin ^a  

^a Ridgetop Group Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACTUATORS; ELECTRIC NETWORK TOPOLOGY; ELECTRONIC EQUIPMENT; MICROELECTRONICS; MOSFET DEVICES; SWITCHING SYSTEMS; UBIQUITOUS COMPUTING;

COMPLEX MODULES; ELECTRONIC MODULES; ELECTRONIC PROGNOSTICS; SWITCHED MODE POWER SUPPLIES;

ELECTRIC POWER SYSTEMS;

EID: 35549005321     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2007.02.021     Document Type: Article

References (6)

1. Pfleuger, Karl. Power-supply reliability: a practical improvement guide, In: EDN, March 3; 1997.
2. Hess, Andy. JSF prognostics/health management. In: IEEE aerospace conference; March 2001.
3. Goodman D.L. Prognostic methodology for deep submicron semiconductor failure modes. IEEE Trans Packag Technol 24 1 (2001) 109-111
4. Mishra S, Pecht M, Goodman DL. In-situ sensors for product reliability monitoring. In: Proceedings of design, test, integration and packaging of MEMS/MOEMS symposium, DTIP 2004, Montreux, May 2004.
5. Goodman D, Vermeire B, Ralston-Good J, Graves R. A board-level prognostic monitor for MOSFET TDDB. In: IEEE aerospace conference, Big Sky, MT; 2006.
6. Hofmeister, James et al. In situ real time detector for faults in solder-joint networks belonging to operational, fully-programmed field programmable gate arrays (FPGAs). In: IEEE proceedings of AUTOTESTCON 2006, Anaheim, CA, September 18-21; 2006. p. 237-43.