Nanostructure-dependent vertical charge transport in MEH-PPV films

Advanced Functional Materials

Volumn 17, Issue 15, 2007, Pages 2902-2910

  Huang, Yi Fang ^a,b   Inigo, Anto R ^a,b   Chang, Chia Chen ^a,b   Li, Kang Chuang ^a,b   Liang, Chiao Fan ^a,b   Chang, Chan Wei ^a,b   Lim, Tsong Shin ^a,b   Chen, Su Hua ^c   White, Jonathon David ^d   Jeng, U Ser ^e   Su, An Chung ^f,g   Huang, Ying Sheng ^h   Peng, Kang Yung ^f   Chen, Show An ^f   Pai, Woei Wu ^b   Lin, Chen Hong ^b   Tameev, Alexey R ⁱ   Novikov, Sergey V ⁱ   Vannikov, Anatoly V ⁱ   Fann, Wun Shain ^a,b  

^a INSTITUTE OF ATOMIC AND MOLECULAR SCIENCES   (Taiwan)

^b NATIONAL TAIWAN UNIVERSITY   (Taiwan)

^c NATIONAL DONG HWA UNIVERSITY   (Taiwan)

^d YUAN ZE UNIVERSITY   (Taiwan)

^e NATIONAL SYNCHROTRON RADIATION RESEARCH CENTER   (Taiwan)

^f NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^g NATIONAL SUN YAT SEN UNIVERSITY   (Taiwan)

^h NATIONAL TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

ⁱ FRUMKIN INSTITUTE OF PHYSICAL CHEMISTRY AND ELECTROCHEMISTRY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARRIER MOBILITY; CHARGE TRANSFER; FIELD EMISSION; MORPHOLOGY; NANOSTRUCTURES; OPTICAL MICROSCOPY; PHOTOLUMINESCENCE SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY;

FLUORESCENCE OPTICAL MICROSCOPY; PHOTOLUMINESCENCE EXCITATION SPECTROSCOPY; X-RAY REFLECTIVITY;

THIN FILMS;

EID: 35548971659     PISSN: 1616301X     EISSN: 16163028     Source Type: Journal    
DOI: 10.1002/adfm.200600825     Document Type: Article

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