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Applied Physics Letters

Volumn 86, Issue 9, 2005, Pages 1-3

Thickness scaling of the space-charge-limited current in poly (p -phenylene vinylene)

(4) Blom, P W M a Tanase, C a De Leeuw, D M b Coehoorn, R b

a UNIVERSITY OF GRONINGEN (Netherlands)

b PHILIPS RESEARCH LABORATORIES (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; ELECTRIC CURRENTS; ELECTRIC SPACE CHARGE; LIGHT EMITTING DIODES; SEMICONDUCTOR DIODES; STRUCTURE (COMPOSITION); THICKNESS MEASUREMENT;

FIELD ENHANCEMENT FACTORS; HOLE-INJECTING ELECTRODES; POLY(P-PHENYLENE VINYLENE); SPACE-CHARGE LIMITED (SCL) DIODES;

AROMATIC POLYMERS;

EID: 17044371613 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1868865 Document Type: Article

Times cited : (113)

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